第三代
半导体测试家族
Third generation semiconductor testing family
分类
QT-4100 power device test system
Suitable for electrical parameter testing of MOSFET, SIC, IGBT, gallium nitride, diodes, transistors, thyristors, solid-state discharge tubes, three-terminal voltage regulators, optocouplers, etc.Provide a complete set of mature test solutions, fully support DC, EAS, RGCG, thermal resistance, SW switch characteristics, short circuit test, TRR, QG and other dynamic and static parameter tests.Multiple stations test data can be merged.
|
Voltage and current limiting |
High-precision Rdon test |
Modular functionality |
Multi-station data merge |
| Type |
QT-4100 power device test system |
| Advantages |
Fool-proof measurement: automatic self-test for voltage and current measurement, automatic alarm and shutdown when abnormal Ultra LOW RDON test Quick self-test: no external load required, self-test completed in 2 minutes Third-party calibration: Calibrated using Agilent 34401A Built-in oscilloscope function Support data merging of multi-station equipment Maximum voltage 8000V, maximum current 2000A |
| Main Features |
? Relay 3ms; ? Voltage limiting and current limiting protection; ? Support extended EAS, LCR, thermal resistance, SW, TRR, QG; ? Form-filling programming; ? Support PAT function; ? Equipped with SECS/GEM standard interface |
Recommend推荐产品
|
中国广东省佛山市南海国家高新区新光源产业基地光明大道16号 |
|
0757 83207313 (销售) |
|
0757 83208786 (销售) |
|
info@baobao8663.cn |
佛山市联动科技股份有限公司 版权所有 baobao8663.cn ? 2015 | 隐私政策 | Sitemap 粤ICP备17127080号-1
