第三代
半导体测试家族
Third generation semiconductor testing family
分类
KGD (Know Good Die) testing solution
Supports high temperature and normal temperature testing: DC+SW+UIL+DC&RG; Support testing pin card protection scheme; Provide a complete set of testing + sorting solutions;
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Pin card
protection |
Two-DUT test in parallel |
High temperature and normal temperature |
Data merge |
| Model | KGD testing solutions |
| Product Advantages |
? Low spurious solutions; ? Exclusive pin card protection patented technology; ? Overload and undervoltage protection; ? Test two wafers at a time; ? Supports high temperature heating |
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Recommend推荐产品
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中国广东省佛山市南海国家高新区新光源产业基地光明大道16号 |
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0757 83207313 (销售) |
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0757 83208786 (销售) |
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info@baobao8663.cn |
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