Prober
Suitable for automatic probe testing of wafers such as 6 and 8″ Si and SiC discrete devices, power devices, integrated circuits, radio frequency devices, optical chips, etc. Automatic loading and unloading, Wafer ID reading. Fully automatic CCD visual n
|
Suspended power supply |
Multiple sites in parallel |
Multi-channel high precision |
Supports multiple extensions |
| Model | Prober |
| Product introduction |
Suitable for automatic probe testing of wafers such as 6 and 8″ Si and SiC discrete devices, power devices, integrated circuits, radio frequency devices, optical chips, etc.
Automatic loading and unloading, Wafer ID reading. |
| Features |
? Fully automatic CCD visual needle positioning. ? High-precision positioning platform. ? Support normal high temperature testing. ? Generate Mapping display Bin in real time. ? Universal GPIB, TTL, R-232 interface. |
Recommend推荐产品
|
中国广东省佛山市南海国家高新区新光源产业基地光明大道16号 |
|
0757 83207313 (销售) |
|
0757 83208786 (销售) |
|
info@baobao8663.cn |
佛山市联动科技股份有限公司 版权所有 baobao8663.cn ? 2015 | 隐私政策 | Sitemap 粤ICP备17127080号-1
