Third generation
Semiconductor Testing
family
Third generation semiconductor testing family
MENU
QT-4100 power device test system
Suitable for electrical parameter testing of MOSFET, SIC, IGBT, gallium nitride, diodes, transistors, thyristors, solid-state discharge tubes, three-terminal voltage regulators, optocouplers, etc.Provide a complete set of mature test solutions, fully support DC, EAS, RGCG, thermal resistance, SW switch characteristics, short circuit test, TRR, QG and other dynamic and static parameter tests.Multiple stations test data can be merged.
|
Voltage and current limiting |
High-precision Rdon test |
Modular functionality |
Multi-station data merge |
| Type |
QT-4100 power device test system |
| Advantages |
Fool-proof measurement: automatic self-test for voltage and current measurement, automatic alarm and shutdown when abnormal Ultra LOW RDON test Quick self-test: no external load required, self-test completed in 2 minutes Third-party calibration: Calibrated using Agilent 34401A Built-in oscilloscope function Support data merging of multi-station equipment Maximum voltage 8000V, maximum current 2000A |
| Main Features |
? Relay 3ms; ? Voltage limiting and current limiting protection; ? Support extended EAS, LCR, thermal resistance, SW, TRR, QG; ? Form-filling programming; ? Support PAT function; ? Equipped with SECS/GEM standard interface |
|
No. 16 Guangming Avenue, New Light Source Industry Base, Nanhai National High tech Zone, Foshan City, Guangdong Province, China |
|
+86 757 83207313 (Sales) |
|
+86 757 83208786 (Sales) |
|
info@baobao8663.cn |
Copyright PowerTECH industrial Co., Ltd. Powertechsmemi.com ? 2015 | Privacy policy | Sitmap 粤ICP备17127080号-1
